Chips captured using less common methods
Pseudo-common methods maybe should get their own pages: * SEM * Darkfield
Image | Vendor | ID | Author/setup | Notes |
---|---|---|---|---|
![]() | Atmel | ataes132-mah-er-t | McMaster | Link |
![]() | Broadcom | bcm5976c1kub6g | bunnie | Link |
![]() | Broadcom | bcm59365 | bunnie | Link |
![]() | californiamicro | 65sc02 | bunnie | Link |
![]() ![]() | efabless | sky130-mpw7 | bunnie | Link |
![]() | Marvell | 88ap6bl02 | bunnie | Link |
![]() | Microchip | PIC12F609 | 4e71 | Link Has detailed setup pictures |
![]() | Mediatek | mt6331 | bunnie | Link |
![]() | NXP | imx6q | bunnie | Link |
![]() | rockwell | 65c02 | bunnie | Link |
![]() | seiko | s-35199a01 | PoroCYon | Link |
![]() | spacex | catson-v20 | Misc | Link |
Full list:
Vendor | ID | Thickness (um) | Notes |
---|---|---|---|
Atmel | ATSHA204 | 140 | Labsmore IR test |
Samsung | K4H560838D | 300 | Labsmore IR test |
Securid | 2C | 320 | Labsmore IR test |
ST | STM32F107 | 400 | Labsmore IR test |