delayer:rie
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delayer:rie [2014/02/06 06:50] – [Al] mcmaster | delayer:rie [2014/04/23 10:07] (current) – [13.56 MHz] mne | ||
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[Optimization of IEP] says "An adequate amount of ion energy is an important component because it contributes to the sputtering capability of the plasma…The removal of fluorine and other contaminates such as oxides, metal salts, magnesium and lead are enhanced by the physical component of ionic bombardment…However, | [Optimization of IEP] says "An adequate amount of ion energy is an important component because it contributes to the sputtering capability of the plasma…The removal of fluorine and other contaminates such as oxides, metal salts, magnesium and lead are enhanced by the physical component of ionic bombardment…However, | ||
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+ | mne: I had a phone call with a tech at plasma.de: Lower frequency systems (i.e. 40kHz) are typically used for plasma cleaning and the plasma energy is pretty low. For RIE systems and especially for corrosive plasma processes, the use of RF plasma (i.e. 13.56 MHz) with a matching network is recommended. With a low frequency system, it will work as well, but according to the tech, it will take way longer. | ||
===== 2.45 GHz Microwave ===== | ===== 2.45 GHz Microwave ===== |
delayer/rie.1391669435.txt.gz · Last modified: 2014/02/06 06:50 by mcmaster