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invasive [2013/10/20 14:59] – external edit 127.0.0.1 | invasive [2018/02/20 21:08] – [Backside analysis] mcmaster | ||
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====== Backside analysis ====== | ====== Backside analysis ====== | ||
- | Fabs often thin wafers and perform backside analysis to get at the transistors without going through metal. | + | [[backside:start]] |
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- | Sample preparation example: http:// | + | |
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====== Rewiring ====== | ====== Rewiring ====== | ||
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The " | The " | ||
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+ | FIB time can often be rented on an hourly basis from universities and research labs. | ||
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+ | azonenberg is beginning to experiment with FIB. [[azonenberg: | ||
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==== Scratching ==== | ==== Scratching ==== | ||
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* Functional IC Analysis: http:// | * Functional IC Analysis: http:// | ||
+ | * Breaking and Entering through the Silicon: http:// | ||
* Low-Cost Chip Microprobing | * Low-Cost Chip Microprobing | ||
* http:// | * http:// |