This shows you the differences between two versions of the page.
| Both sides previous revisionPrevious revisionNext revision | Previous revisionNext revisionBoth sides next revision | ||
| manufacture [2012/08/13 06:49] – [Wafer testing] mcmaster | manufacture [2012/08/13 07:09] – [Designing the circuit] mcmaster | ||
|---|---|---|---|
| Line 20: | Line 20: | ||
| Programs like Cadence VLSI, Magic VLSI, and others are used to design a circuit and produce CAD files. | Programs like Cadence VLSI, Magic VLSI, and others are used to design a circuit and produce CAD files. | ||
| + | FIXME: put a magic screenshot | ||
| ====== Printing the photomask ====== | ====== Printing the photomask ====== | ||
| Line 42: | Line 43: | ||
| Some circuits can undergo basic testing.by using test pads when still in the wafer. This eliminates the following steps only to find the entire wafer was bad. If too many units are bad during initial testing, the whole process is typically aborted. | Some circuits can undergo basic testing.by using test pads when still in the wafer. This eliminates the following steps only to find the entire wafer was bad. If too many units are bad during initial testing, the whole process is typically aborted. | ||
| - | FIXME: get a picture of a probe card | + | FIXME: get a picture of a probe card (off of my phone...) |
| + | |||
| + | FIXME: add probe scrube marks | ||
| ====== Dicing ====== | ====== Dicing ====== | ||