fi:backside
Differences
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| Both sides previous revisionPrevious revisionNext revision | Previous revision | ||
| fi:backside [2019/04/20 18:44] – mcmaster | fi:backside [2025/09/08 18:22] (current) – mcmaster | ||
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| + | Additional resources here: https:// | ||
| + | |||
| Backside analysis can include: | Backside analysis can include: | ||
| * Imaging transistor layout without delayering | * Imaging transistor layout without delayering | ||
| Line 50: | Line 52: | ||
| * https:// | * https:// | ||
| * Great read on the subject | * Great read on the subject | ||
| + | |||
| + | PICA | ||
| + | * "Well known that well working gates emit light during switching" | ||
| + | * " | ||
| + | * "PICA uses a strobed, intensified detector to gather spatial information and time information" | ||
| + | * Specifically used a ring oscillator as an example of something it can image | ||
| Line 222: | Line 230: | ||
| * Also will try silicon wafers as filters | * Also will try silicon wafers as filters | ||
| * Need to order another MU800? Check inventory | * Need to order another MU800? Check inventory | ||
| - | * Have 3: 1 for pr0nscope, 1 for inspection scope, 1 for brainscope | + | * Have 3: 1 for prawnscope, 1 for inspection scope, 1 for brainscope |
| * Could also use another one for k2scope and one for this | * Could also use another one for k2scope and one for this | ||
| * Order 2 more? | * Order 2 more? | ||
| Line 267: | Line 275: | ||
| * https:// | * https:// | ||
| * https:// | * https:// | ||
| + | * https:// | ||
| + | * https:// | ||
fi/backside.1555785895.txt.gz · Last modified: 2019/04/20 18:44 by mcmaster