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pad [2012/06/21 05:40] – created mcmaster | pad [2012/07/07 02:37] – azonenberg | ||
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Still has a bond wire on it: | Still has a bond wire on it: | ||
{{gallery> | {{gallery> | ||
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+ | Hole left by a bond wire being forcibly pulled off: | ||
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+ | Empty pad (never bonded). Note scratches left by probe needle during wafer test. This is //not// damage from a pulled bond wire. | ||
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Damaged overglass: | Damaged overglass: | ||
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It is very fragile and can easily get completely stripped during decapsulation. | It is very fragile and can easily get completely stripped during decapsulation. | ||
- | Aluminium | + | Aluminum |
{{gallery> | {{gallery> | ||
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