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| sidebar [2013/06/26 04:24] – mcmaster | sidebar [2016/12/02 18:59] – mcmaster | ||
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| * [[Resistor]] | * [[Resistor]] | ||
| * [[Test pattern]] | * [[Test pattern]] | ||
| - | * [[Transistor]] | + | |
| + | | ||
| + | * [[fet|FET/ | ||
| * [[Via]] | * [[Via]] | ||
| - | * [[Wire bonding]] | + | * [[bonding: |
| * [[process_tech|Process Technology]] | * [[process_tech|Process Technology]] | ||
| * Device | * Device | ||
| Line 20: | Line 22: | ||
| * [[delayer: | * [[delayer: | ||
| * [[cleaning|Cleaning]] | * [[cleaning|Cleaning]] | ||
| + | * [[bonding: | ||
| + | * [[bonding: | ||
| + | * [[bonding: | ||
| + | * [[: | ||
| * [[chemical: | * [[chemical: | ||
| * [[equipment: | * [[equipment: | ||
| Line 25: | Line 31: | ||
| * [[physical_protection|Physical protection]] | * [[physical_protection|Physical protection]] | ||
| * [[logic: | * [[logic: | ||
| - | * [[cmos:start|CMOS]] | + | * [[:cmos|CMOS]] |
| * [[bipolar: | * [[bipolar: | ||
| + | * [[Capture|Capture (img=> | ||
| * [[misc|Misc]] | * [[misc|Misc]] | ||
| * [[semi-invasive|Semi-invasive analysis]] | * [[semi-invasive|Semi-invasive analysis]] | ||
| * [[: | * [[: | ||
| - | * [[software: | + | |
| + | | ||
| + | * [[layout_colors|Layout colors]] | ||
| * [[: | * [[: | ||
| * [[: | * [[: | ||
| + | * [[: | ||
| + | * [[: | ||