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backside:start [2018/02/20 21:54] – mcmaster | backside:start [2018/02/20 21:54] – mcmaster | ||
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- | {{: | + | Backside analysis can include: |
* Imaging transistor layout without delayering | * Imaging transistor layout without delayering | ||
* Imaging transistor activity using PMT, camera, etc for side channnel analysis | * Imaging transistor activity using PMT, camera, etc for side channnel analysis |