This is an old revision of the document!
Table of Contents
Invasive techniques actively modify the system in a permanent way.
Backside analysis
Fabs often thin wafers and perform backside analysis to get at the transistors without going through metal. [Functional IC Analysis] doesn't look like they thinned and they got pretty decent results.
Rewiring
Cutting wires
Laser
The “professional” mid range solution. Typically some form of Nd:YAG, either the fundamental or some harmonic. Expect minimum of a few thousand USD for a system, probably many more. Probably the most economical would be to piece together a Mitutoyo microscope. Of course, be careful not to look into your home spun laser while firing without good reason.
FIB
The “professional” high end solution used for small processes. Equipment is rather expensive. (how much?)
Scratching
Microprobes can cut traces by moving back and forth. Professional units use ultrasound.
Chemical
By masking the chip and then etching (ex: with HF) wires can be removed. Masking compounds range from photoresists to nail polish.
Adding wires
Usually done with a fib. Can be done temporarily with microprobes or possibly on a high process chip very carefully with conductive epoxy.
References
- Functional IC Analysis: http://nedos.net/host2012.pdf